Scanning Electron Microscopy (SEM)
Principle of Scanning Electron Microscopy (SEM) SEM scans a focused electron beam across the specimen’s surface. Secondary electrons emitted from the specimen surface are collected to form an image. SEM provides high-resolution, three-dimensional images that reveal the specimen’s surface topology. Procedure for Scanning Electron Microscopy (SEM) Specimen Preparation: Fixation: The specimen is fixed to preserve … Read more